Product Datasheet Search Results:

QUALITY ASSURANCE OF IC MEMORIES.pdf11 Pages, 33 KB, Original
RELIABILITY OF HITACHI IC MEMORIES.pdf23 Pages, 210 KB, Original

Product Details Search Results:

Micro_quality_semiconductor/GPP15A
{"V(FM) Max.(V) Forward Voltage":"1.0","Package":"DO-15","I(O) Max.(A) Output Current":"1.5","@Temp. (°C) (Test Condition)":"25","@Temp (°C) (Test Condition)":"55","@V(R) (V)(Test Condition)":"50","V(RRM)(V) Rep.Pk.Rev. Voltage":"50","Military":"N","I(RM) Max.(A) Reverse Current":"5.0u","@I(FM) (A) (Test Condition)":"1.5","I(RM) Max.(A) Pk. Rev. Current":"5.0u"}...
856 Bytes - 10:26:30, 05 January 2026
Micro_quality_semiconductor/GPP15B
{"V(FM) Max.(V) Forward Voltage":"1.0","Package":"DO-15","I(O) Max.(A) Output Current":"1.5","@Temp. (°C) (Test Condition)":"25","@Temp (°C) (Test Condition)":"55","@V(R) (V)(Test Condition)":"100","V(RRM)(V) Rep.Pk.Rev. Voltage":"100","Military":"N","I(RM) Max.(A) Reverse Current":"5.0u","@I(FM) (A) (Test Condition)":"1.5","I(RM) Max.(A) Pk. Rev. Current":"5.0u"}...
858 Bytes - 10:26:30, 05 January 2026
Micro_quality_semiconductor/GPP15D
{"V(FM) Max.(V) Forward Voltage":"1.0","Package":"DO-15","I(O) Max.(A) Output Current":"1.5","@Temp. (°C) (Test Condition)":"25","@Temp (°C) (Test Condition)":"55","@V(R) (V)(Test Condition)":"200","V(RRM)(V) Rep.Pk.Rev. Voltage":"200","Military":"N","I(RM) Max.(A) Reverse Current":"5.0u","@I(FM) (A) (Test Condition)":"1.5","I(RM) Max.(A) Pk. Rev. Current":"5.0u"}...
858 Bytes - 10:26:30, 05 January 2026
Micro_quality_semiconductor/GPP15G
{"V(FM) Max.(V) Forward Voltage":"1.0","Package":"DO-15","I(O) Max.(A) Output Current":"1.5","@Temp. (°C) (Test Condition)":"25","@Temp (°C) (Test Condition)":"55","@V(R) (V)(Test Condition)":"400","V(RRM)(V) Rep.Pk.Rev. Voltage":"400","Military":"N","I(RM) Max.(A) Reverse Current":"5.0u","@I(FM) (A) (Test Condition)":"1.5","I(RM) Max.(A) Pk. Rev. Current":"5.0u"}...
858 Bytes - 10:26:30, 05 January 2026
Micro_quality_semiconductor/GPP15J
{"V(FM) Max.(V) Forward Voltage":"1.0","Package":"DO-15","I(O) Max.(A) Output Current":"1.5","@Temp. (°C) (Test Condition)":"25","@Temp (°C) (Test Condition)":"55","@V(R) (V)(Test Condition)":"600","V(RRM)(V) Rep.Pk.Rev. Voltage":"600","Military":"N","I(RM) Max.(A) Reverse Current":"5.0u","@I(FM) (A) (Test Condition)":"1.5","I(RM) Max.(A) Pk. Rev. Current":"5.0u"}...
858 Bytes - 10:26:30, 05 January 2026
Micro_quality_semiconductor/GPP15K
{"V(FM) Max.(V) Forward Voltage":"1.1","Package":"DO-15","I(O) Max.(A) Output Current":"1.5","@Temp. (°C) (Test Condition)":"25","@Temp (°C) (Test Condition)":"55","@V(R) (V)(Test Condition)":"800","V(RRM)(V) Rep.Pk.Rev. Voltage":"800","Military":"N","I(RM) Max.(A) Reverse Current":"5.0u","@I(FM) (A) (Test Condition)":"1.5","I(RM) Max.(A) Pk. Rev. Current":"5.0u"}...
858 Bytes - 10:26:30, 05 January 2026
Micro_quality_semiconductor/GPP15M
{"V(FM) Max.(V) Forward Voltage":"1.1","Package":"DO-15","I(O) Max.(A) Output Current":"1.5","@Temp. (°C) (Test Condition)":"25","@Temp (°C) (Test Condition)":"55","@V(R) (V)(Test Condition)":"1.0k","V(RRM)(V) Rep.Pk.Rev. Voltage":"1.0k","Military":"N","I(RM) Max.(A) Reverse Current":"5.0u","@I(FM) (A) (Test Condition)":"1.5","I(RM) Max.(A) Pk. Rev. Current":"5.0u"}...
860 Bytes - 10:26:30, 05 January 2026
Micro_quality_semiconductor/GS405
{"V(FM) Max.(V) Forward Voltage":"1.8","I(FSM) Max.(A) Pk.Fwd.Sur.Cur.":"250","Package":"DO-203AA","@Temp (°C) (Test Condition)":"100","@Temp. (°C) (Test Condition)":"25","@t(w) (s) (Test Condition)":"8.3m","@V(R) (V)(Test Condition)":"50","V(RRM)(V) Rep.Pk.Rev. Voltage":"50","Military":"N","I(RM) Max.(A) Reverse Current":"10u","@I(FM) (A) (Test Condition)":"40","I(O) Max.(A) Output Current":"12","I(RM) Max.(A) Pk. Rev. Current":"10m"}...
943 Bytes - 10:26:30, 05 January 2026
Micro_quality_semiconductor/GS405A
{"V(FM) Max.(V) Forward Voltage":"1.8","I(FSM) Max.(A) Pk.Fwd.Sur.Cur.":"250","Package":"DO-203AA","@Temp (°C) (Test Condition)":"100","@Temp. (°C) (Test Condition)":"25","@t(w) (s) (Test Condition)":"8.3m","@V(R) (V)(Test Condition)":"50","V(RRM)(V) Rep.Pk.Rev. Voltage":"50","Military":"N","I(RM) Max.(A) Reverse Current":"10u","@I(FM) (A) (Test Condition)":"40","I(O) Max.(A) Output Current":"12","I(RM) Max.(A) Pk. Rev. Current":"10m"}...
947 Bytes - 10:26:30, 05 January 2026
Micro_quality_semiconductor/GS41
{"V(FM) Max.(V) Forward Voltage":"1.8","I(FSM) Max.(A) Pk.Fwd.Sur.Cur.":"250","Package":"DO-203AA","@Temp (°C) (Test Condition)":"100","@Temp. (°C) (Test Condition)":"25","@t(w) (s) (Test Condition)":"8.3m","@V(R) (V)(Test Condition)":"100","V(RRM)(V) Rep.Pk.Rev. Voltage":"100","Military":"N","I(RM) Max.(A) Reverse Current":"10u","@I(FM) (A) (Test Condition)":"40","I(O) Max.(A) Output Current":"12","I(RM) Max.(A) Pk. Rev. Current":"10m"}...
941 Bytes - 10:26:30, 05 January 2026
Micro_quality_semiconductor/GS41A
{"V(FM) Max.(V) Forward Voltage":"1.8","I(FSM) Max.(A) Pk.Fwd.Sur.Cur.":"250","Package":"DO-203AA","@Temp (°C) (Test Condition)":"100","@Temp. (°C) (Test Condition)":"25","@t(w) (s) (Test Condition)":"8.3m","@V(R) (V)(Test Condition)":"100","V(RRM)(V) Rep.Pk.Rev. Voltage":"100","Military":"N","I(RM) Max.(A) Reverse Current":"10u","@I(FM) (A) (Test Condition)":"40","I(O) Max.(A) Output Current":"12","I(RM) Max.(A) Pk. Rev. Current":"10m"}...
944 Bytes - 10:26:30, 05 January 2026
Micro_quality_semiconductor/GS42
{"V(FM) Max.(V) Forward Voltage":"1.8","I(FSM) Max.(A) Pk.Fwd.Sur.Cur.":"250","Package":"DO-203AA","@Temp (°C) (Test Condition)":"100","@Temp. (°C) (Test Condition)":"25","@t(w) (s) (Test Condition)":"8.3m","@V(R) (V)(Test Condition)":"200","V(RRM)(V) Rep.Pk.Rev. Voltage":"200","Military":"N","I(RM) Max.(A) Reverse Current":"10u","@I(FM) (A) (Test Condition)":"40","I(O) Max.(A) Output Current":"12","I(RM) Max.(A) Pk. Rev. Current":"10m"}...
941 Bytes - 10:26:30, 05 January 2026

Documentation and Support

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QUALITY_MANAGEMENT_SOLUTIONS_BROCHURE_QMS_QCS800XA_QUALITY_CONTROL_SYSTEM.pdf5.881Request
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KEY_MANAGEMENT_SERVICE_KMS_8_5_1_PRODUCT_SOFTWARE_QUALITY_STANDARD_FOR_HUAWEI_CLOUD_STACK_8_5_1_01.pdf0.291Request